Data Acquisition System for Semiconductor Testing

Online monitoring system for semiconductor testing continuously monitors up to twelve testing systems, acquiring, displaying and storing sampled data at sample rate between 500 and 5000 samples-per-second. Each system can be controlled and monitored independently. Tests information are stored into the SQL database and actual recorded data into the binary file in the file system, linked to the database.

Data acquisition:

Measurement and data acquisition is performed with twelve Keysight 3446xA DMM's connected over the Ethernet network to the data acquisition PC computer.

DAQ system

Video below presents the functionality of developed software:


Data view:

Separate data view application is developed for retrieving and displaying acquired data. Segment of interest could be exported to the text file for further analysis, as shown in the video below: